Abstract: Load cycle test is a critical evaluation method for assessing the long-term thermal performance of full-scale HV and EHV cables. Optimizing the application strategy of the heating load ...
Abstract: This paper introduces a methodology designed to predict the reliability of optoelectronic devices through accelerated testing. To imitate an industrial silicon photonics chip, we fabricated ...
More often than not software systems are displayed as layers. The top-most components use the ones below but not vice-versa. Ideally the package/namespace/module structure reflects the layers, eg: ...
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