Abstract: Resist line edge roughness (LER) is generally regarded as noise residues accumulated in every lithography processing step. Current state of art LER simulators model the physical causes of ...
Abstract: Perception algorithms are ubiquitous in modern autonomy stacks, providing necessary environmental information to operate in the real world. Many of these algorithms depend on the visibility ...
A Powerful CSS Animation Library for Advanced Motion Design. Zero JS Required. Over 500 Effects, Letter, Word & Line Stagger Animations, Utilities, and easy CDN or ...
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