Reliability Assessment and Life Time Prediction of FinFET Devices for Future Electronic Applications
Abstract: FinFET technology is a major leap from the traditional MOSFET and hence can really be a game changer for the electronic devices in terms of high performance and low power operation and the ...
Abstract: The effects of proton-induced multiple-cell upsets (MCUs) on 16 and 12-nm fin field effect transistor (FinFET) static random access memories (SRAMs) were studied. Their dependence on the ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback