Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...

Abstract: Surface defect localization is indispensable for the quality control of industrial products in the manufacturing process, supervised dense prediction of defect areas requires laborious and ...

AI-powered test automation is redefining software reliability by reducing flaky tests, expanding coverage, and accelerating ...

Abstract: Class imbalance presents considerable challenges for software defect prediction. However, software defect datasets exhibit additional complex characteristics, with class overlap being the ...