Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...

For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

These days, there is a requirement of achieving high frequency targets with lower power consumption. Achieving both targets simultaneously is very difficult and the situation becomes even more complex ...

Design for test (DFT) has been around since the 1960s. The technology was developed to reduce the cost of creating a successful test for an IC. Scan design, fault models, and automatic test pattern ...

The complicated silicon defect types and defect distribution of new IC manufacturing technologies can result in very low yield for new designs and technology nodes. During technology qualification ...

The new imageFORMULA DR-C125 incorporates a unique vertical J-path document transport system to save space when scanning Delivers intuitive scanning by feeding documents face-up, and with full ...