EDN

Design for test boot camp, part 4: Built-in self-test

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then ...
EDN

Design for test boot camp, part 1: Scan test

My colleagues from Mentor Graphics, Ron Press, Martin Keim, and I often write about various aspects of digital IC test. If you started following the Test Voices blog when it was part of Test & ...
The Next Web

20 creative ways to test your design

Jerry Cao is a content strategist at UXPin — a wireframing and prototyping app with built-in usability testing — where he develops in-app and online content for the wireframing and prototyping ...
Semiconductor Engineering

Design for Test (DFT)

Techniques that reduce the difficulty and cost associated with testing an integrated circuit. This can result in a decrease in the time spent on a tester, a decrease in cost associated with generating ...
Electronic Design

Using EDT Test Points to Reduce Test Time and Cost

The exponential growth in design sizes has rendered the traditional methods of design-for-test, layout, and timing closure no longer sufficient. Design and test engineers not only have to constantly ...
Semiconductor Engineering

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...
Electronic Design

Low-pin-count test helps manage test cost

The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...