MXenes are an important recent discovery in two-dimensional (2D) materials research. Since the unique 2D material class was discovered, electron microscopy techniques have been the primary method used ...

This degree of magnification and resolution is made possible by the use of a Focused Ion Beam Scanning Electron Microscope, or FIB-SEM. Ordinary microscopes will not produce the same results. Curious ...

Scanning electron microscopy (SEM) has been an important tool for forensic science since the 1970s, and it continues to find forensic applications today. The technique – capable of 100,000x ...

Current silicon semiconductors can be as small as 20 nm in size, making them an ideal option for fast computing using minimal energy. Technology at the nanoscale has both advantages and disadvantages.

The film provides an introduction to electron microscopy, detailing its historical development and technical mechanisms. It highlights the evolution from light microscopes to electron microscopes, ...